HD Prime Technical Specifications for Substrate Analysis and Children’s Product Safety

The Right Technology Matters: HD Prime Technical Specifications

Unprecedented Levels of Detection Available Only With HDXRF

HDXRF diagramHDXRF is an elemental analysis technique that uses patented DC optics to enhance measurement and precision for children’s product testing for substrate analysis that guarantees children’s products safety.

An important benefit of HDXRF is that it provides elemental quantification in the coating and substrate separately. Multiple DCC optics capture x-rays from a divergent x-ray beam emitted from the tube and the optics redirect several select and narrow energy regions into an intense and focused beam on the surface of the product.

By selectively using multiple monochromatic-excitation beams, ranging from low to high energy, HDXRF allows the user to quantify toxic element concentrations for both the coating and the base materials separately.

Using monochromatic-excitation HDXRF eliminates the scattering background under the fluorescence peaks, greatly enhancing elemental detection limits. The technique of applying focused excitation beams also provides a true, highly focused, 1-mm analysis area. The diagram shows the basic configuration of HDXRF used to provide toxic element detection in toys and children’s products.

LOD in ppm Pb Cd Cr As Br Sb Se Hg Ba Cl
Plastic Substrate .8 2 2 .8 1 5 1 1 200 100*
PVC Substrate 1 2 5 1 1 5 1 2 200 N/A
Coating on Plastic 5 50* 15 5 5 100* 5 8 200* 150*
Metal Substrate 10 5 15 8 N/A 10 5 10 200* N/A
Coating on Metal 8 30* 15 8 5 60* 5 10 200* 150*